Dft

• Yosys DFT plugins (yosys) — basic scan insertion for open-source flows
• OpenROAD DFT utilities (openroad) — scan insertion within the OpenROAD/ORFS flow

Proprietary

• Synopsys TetraMAX ATPG (tmax) — pattern generation, fault simulation, and compression
• Cadence Modus Test (modus) — ATPG, scan DRC, and diagnosis
• Siemens Tessent (tessent) — full DFT suite: scan, ATPG, MBIST, IJTAG

Stage: dft_architecture

Domain Rules

1. Scan architecture: full-scan preferred for ASIC; capture all sequential elements
2. Scan chain count: √(total flip-flops) as rule of thumb; balance test time vs routing
3. Chain length balance: ±5% of target length across all chains
4. Compression: EDT/OPMISR for designs > 1M FFs to reduce ATE test time
5. MBIST: one controller per memory group (same width/depth class)
6. JTAG: IEEE 1149.1 TAP controller; boundary scan for all IO pins
7. At-speed test: launch-on-capture (LOC) or launch-on-shift (LOS) — agree with test team
8. Test modes: scan_mode, mbist_mode, jtag_mode must be mutually exclusive
9. Power domains: scan must respect UPF power domain boundaries

DFT IO Signals Required

• scan_en (SE): primary input, must be controllable from ATE
• scan_in[] (SDI): one per chain
• scan_out[] (SDO): one per chain
• test_clk: separate from functional clock or gated version

QoR Metrics to Evaluate

• DFT spec completeness: all elements defined before insertion
• Estimated fault coverage: analytical pre-insertion estimate ≥ target
• Estimated test time: within ATE budget

Output Required

• DFT architecture document
• Scan chain plan (count, estimated length, IOs)
• Test mode definitions

Stage: scan_insertion

Domain Rules

1. Replace all standard FFs with scan-equivalent cells (SDFF, SDFFRQ, etc.)
2. Exclude from scan: memory-mapped registers, MBIST controllers, JTAG cells
3. Do not place scan in: clock gating enables, async set/reset paths (without care cells)
4. EDT compression: insert compressor/decompressor for > 100K FFs
5. Lockup latches: insert between chains crossing clock domain boundaries
6. Scan re-ordering: minimise routing wirelength (use placement-aware reorder)
7. Test points: add controllability/observability points for low-coverage nets

Scan DRC Rules (all must pass before ATPG)

• No clock signals feeding into scan data path
• No combinational feedback loops through scan
• Scan enable is glitch-free during functional mode
• All scan FFs: correct SI/SE connections

QoR Metrics to Evaluate

• Scan FF count: 100% of sequential elements minus explicit exclusions
• Chain count and length: per architecture spec (±5%)
• Scan DRC: 0 errors

Output Required

• Scan-inserted netlist
• Scan chain definition file (.scandef)
• Scan DRC report

Stage: atpg

Fault Model Targets

Domain Rules

1. Run ATPG at multiple capture clocks (slow and fast for transition)
2. X-bounding: apply to improve pattern quality
3. Untestable faults: classify as Redundant or ATPG-Untestable; document all
4. Pattern compression: use compressed patterns for EDT designs
5. At-speed patterns: verify capture timing with STA before signing off
6. Good-machine simulation: run all patterns on RTL or gate sim — 0 failures allowed

QoR Metrics to Evaluate

• SAF coverage: ≥ 99%
• Transition coverage: ≥ 95%
• Pattern count: minimised (ATE time = test cost)
• Good-machine simulation: 0 failures

Output Required

• Test pattern file (STIL or WGL)
• Fault report (coverage per model)
• Untestable fault list with classification

Stage: bist_insertion

MBIST Rules

1. One MBIST controller per memory group (same width/depth class)
2. March algorithm: MATS+, March-C, or as required by quality spec
3. Memory isolation: memories disconnected from logic during BIST
4. Power: verify IR drop with all memories running BIST simultaneously
5. Access: via JTAG TAP or dedicated BIST port

LBIST Rules (if required)

1. STUMPS architecture: PRPG + MISR + scan chains
2. Alias probability: target < 1e-10
3. LBIST clock: separate from functional clock (usually divided)

QoR Metrics to Evaluate

• MBIST: all memory instances covered
• MBIST fault coverage: ≥ 99%
• BIST power: within IR drop budget during test
• LBIST alias probability: within target (if applicable)

Output Required

• BIST-inserted netlist
• BIST controller connection report
• MBIST fault coverage report
• BIST power estimate

Stage: jtag_setup

Domain Rules

1. TAP pins: TCK, TMS, TDI, TDO, TRST_N — dedicated pads required
2. Boundary scan cells: all digital IO pins must have BSR cells
3. Mandatory instructions: BYPASS, IDCODE, SAMPLE/PRELOAD, EXTEST
4. IDCODE register: 32-bit, unique per device, per IEEE 1149.1
5. TAP: accessible when core is in reset
6. Security: JTAG lockout mechanism for production (OTP/fuse based)

QoR Metrics to Evaluate

• TAP DRC: all required instructions implemented
• Boundary scan chain: all IOs included
• JTAG connectivity simulation: passes
• IDCODE: unique and correctly formatted

Output Required

• JTAG-inserted netlist
• BSDL file
• TAP connectivity report

Stage: dft_signoff

Sign-off Checklist

• Scan DRC: 0 errors
• SAF coverage: ≥ 99% (or agreed target)
• Transition coverage: ≥ 95%
• Good-machine simulation: 0 failures
• MBIST: all memories covered
• JTAG: BSDL generated and verified
• DFT netlist: LEC vs pre-DFT netlist EQUIVALENT

Output Required

• DFT sign-off report
• Final test pattern files
• BSDL file
• DFT netlist (input to PD)

Memory

Write on stage completion

After each stage completes (regardless of whether an orchestrator session is active), write or overwrite one JSON record in memory/dft/experiences.jsonl keyed by run_id. This ensures data is persisted even if the flow is interrupted or called without full orchestrator context.

Use run_id = dft_<YYYYMMDD>_<HHMMSS> (set once at flow start; reuse on each stage update). Every JSON record written must include a top-level "run_id" field whose value matches this key — reject or regenerate if missing before writing. Set signoff_achieved: false until the final sign-off stage completes.