Materials characterization skill. XRD pattern analysis, SEM/TEM image processing, spectroscopy data analysis (XPS/FTIR/Raman), and materials property database queries. Use when working with xrd pattern analysis, sem/tem image processing, spectroscopy data analysis (xps/ftir/raman).
Materials characterization skill. XRD pattern analysis, SEM/TEM image processing, spectroscopy data analysis (XPS/FTIR/Raman), and materials property database queries.
logs/process-log.jsonl.report.md: concise method, results, interpretation, and file inventory in the user's language.results/: structured outputs, metrics, model artifacts, or extracted findings.figures/: English-only charts, diagrams, or panels when visual output is needed.data/: processed or derived datasets when transformation occurs.report.md and logs/process-log.jsonl reference the generated artifacts.If any gate fails: identify the specific failing check, fix the issue, and re-validate before proceeding.
logs/process-log.jsonl is updated with execution trace