X-ray Photoelectron Spectroscopy analysis skill for surface composition, chemical state, and depth profiling
The XPS Surface Analyzer skill provides comprehensive X-ray Photoelectron Spectroscopy data analysis for nanomaterial surface characterization, enabling quantitative determination of surface composition, chemical states, and depth-dependent composition profiles.
Survey Spectra
Peak Fitting
Quantification
{
"sample_id": "string",
"elements_of_interest": ["string"],
"analysis_type": "survey|high_resolution|depth_profile",
"charge_reference": "C1s|Au4f|other"
}
{
"composition": [{
"element": "string",
"concentration": "number (at%)",
"uncertainty": "number"
}],
"chemical_states": [{
"element": "string",
"state": "string",
"binding_energy": "number (eV)",
"fraction": "number (%)"
}],
"depth_profile": {
"depths": ["number (nm)"],
"compositions": [{}]
}
}