Semiconductor Test Overlay

Additional RECOMMENDATION Rules

• Use statistical process control (SPC) patterns for monitoring test health
• Implement Cpk calculation utilities for manufacturing readiness
• Use parallel test patterns where hardware supports it — document resource contention
• Cache calibration data with expiry — don't re-calibrate every DUT
• Use data compression for high-volume waveform capture storage

Test Program Structure

TestProgram/
├── Config/           # Limits, flow definitions, station config
├── Drivers/          # Instrument abstraction layer
├── TestModules/      # Individual test implementations
├── DataLog/          # Result logging and formatting
├── Utilities/        # Shared helpers (math, string, file I/O)
└── Main/             # Flow control and sequencing

Instrument Communication Pattern

1. Send command → 2. Wait for OPC (*OPC?) → 3. Query result → 4. Check SYST:ERR → 5. Parse and validate