Time-of-Flight Secondary Ion Mass Spectrometry skill for molecular surface analysis and imaging
The ToF-SIMS Analyzer skill provides molecular-level surface analysis capabilities for nanomaterials, enabling identification of surface species, chemical imaging, and depth profiling with high sensitivity.
Spectral Analysis
Imaging Mode
Depth Profiling
{
"sample_id": "string",
"analysis_mode": "spectral|imaging|depth_profile",
"primary_ion": "Bi3+|Bi1+|C60+",
"polarity": "positive|negative",
"area_of_interest": {"x": "number", "y": "number"}
}
{
"identified_species": [{
"mass": "number (amu)",
"assignment": "string",
"intensity": "number"
}],
"chemical_maps": [{
"species": "string",
"image_path": "string"
}],
"pca_results": {
"principal_components": "number",
"variance_explained": ["number"]
}
}