Atomic Force Microscopy and Scanning Probe Microscopy skill for nanoscale topography, mechanical, and electrical property mapping
The AFM-SPM Analyzer skill provides comprehensive atomic force and scanning probe microscopy data analysis for nanoscale surface characterization, including topography, mechanical properties, and electrical measurements.
Topography Analysis
Mechanical Mapping
Electrical Measurements
{
"data_file": "string",
"analysis_type": "topography|force_curves|mechanical|electrical",
"cantilever_specs": {
"spring_constant": "number (N/m)",
"tip_radius": "number (nm)"
}
}
{
"topography": {
"Ra": "number (nm)",
"RMS": "number (nm)",
"Rmax": "number (nm)",
"image_path": "string"
},
"mechanical": {
"modulus": "number (GPa)",
"adhesion": "number (nN)",
"deformation": "number (nm)"
},
"electrical": {
"surface_potential": "number (mV)",
"work_function": "number (eV)"
}
}